AR Light Guide Plate Grating Analysis System
A high-precision diffraction system that can comprehensively evaluate the quality of AR light guide plate gratings.
It is possible to measure all types of grating samples regardless of type or substrate, measure the pitch and direction of the diffraction grating, and detect defects in the grating structure with high precision on the picometer and arc-second scale. The uniformity of the grating structure can be evaluated over a wide area.
- Company：日本レーザー
- Price：Other
